Semilab is proud to release a new generation Contactless Resistivity Mapping Tool for Semi-insulating Wafers, the updated Corema-2000.

Semilab's COREMA-2000 system is based on a contactless capacitance technique used for precise resistivity characterization of semi-insulating compound semiconductors over a wide resistivity range, useful for the device manufacturing industry.

Knowing the uniformity of resistivity values is critical to achieving process optimization. With the new, specially designed and more stable COREMA-2000 Gen2 platform, Semilab offers the next level of excellence in routine production control for radio frequency, photonics and high-power electronics manufacturers. Corema-2000 is designed to handle various compound semiconductor substrates, like GaAs, SiC, GaN, CdTe, Ga₂O₃ with excellent repeatability and a wider measurement range.

Contact us to learn more and level up your resistivity measurement capabilities with the new generation Corema-2000!