Semilab | Japan

Japan

Office: Semilab Japan K.K.
Address: YS Shin-Yokohama Bldg. 6F, 2-15-10, Shin-Yokohama, Kohoku-ku, Yokohama-shi Kanagawa 2220033 Japan
Tel: +81 45 620 7960
Fax: +81 45 476 2146
Email: info.japan@semilab.com
Web: www.semilab-j.jp

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R&D
PV
Semiconductor
Other

CMS, CLS
PLB-55i Silicon Block Scanner
PN-100
RT-110
RT-1000
SHR-1000
WxL
WMT, WLT
WT-1200 & WT-1200B
WT-2010D
WT-2000P
WT-2000PVN
ACV-2200, ACV-3000, ACV-3100 Non-contact Resistivity Profiling Systems
FAaST 300-SL
PS-2000, PS-2500
SE-3000
MCV-2200, MCV-2500, MCV-3000, MCV-3000P
FCV-3000N Modular CV/IV Metrology System
RT-2201, RT-2500, RT-3000 Sheet Resistance Metrology Systems
SE-2000EPA Spectroscopic Ellipsometer
DLS-1000 Deep Level Transient Spectrometer
PUV SE
SW-3300
WT-2000
SRP-2100 Spreading Resistance Profiler
DLS-83D Deep Level Transient Spectrometer
WT-2000MCT
QC-series
Atomic Force Microscope - Proberstation 1000
PMR-3000S Ion Implant Dose Monitor S
SE-2000 Spectroscopic Ellipsometer
SE-1000 Spectroscopic Ellipsometer - Tabletop Manual System
PSI-3000 Polarized Stress Imaging System
inSE-1000 In-Situ Spectroscopic Ellipsometer
SRP-170 Spreading Resistance Profiler
MCV-530, MCV-530L
WT-2000 Wafer Tester - Tabletop System
WT-2000 / 2A
WT-1200i
WT-2200, WT-2500, WT-3000
LST-2500HD Light Scattering Tomograph High Dynamic-range System
SIRM-2100, SIRM-2500, SIRM-3000
Cryostats for Semilab DLS systems
PVS-6000
PLB-55 Photoluminescence Silicon Block Imaging System
WT-2000 PL
LE-103PV
LE-100IL
SE-100IL
LE-5100
SE-2000-IR Spectroscopic Ellipsometer (IR)
R2R SE - Roll-to-Roll Spectroscopic Ellipsometer
PLI-101/A, PLI-103/A
EIR-2500
FPT
µSE-2500
PLI-1001/A, PLI-1003/A
PVS-5000
WT-1200A
FPT
FPT
FPT
PV-2000A
IR-2100, IR-2200, IR-2500, IR-3200
SEIR-3000
FPT
SEM-AFM
Sample Transfer Shuttle
SE-2100
WT-2000PI
TTR-300
FAaST 310/210 SPV
FAaST 330/230 DSPV
FAaST 350 DSPV
FAaST 350 C-V / I-V
FAaST 330/230 C-V / I-V
FAaST 310/210 C-V / I-V
CV-1500
SCI 1-6
WT-2000PVN
FPP-1000
PVS-5100
PVS-6000
SE-2000 Spectroscopic Ellipsometer
SE-2100
En-Vision-3000
RT-2500, RT-3000
IND-1000
PLB-55r Ingot Stress Inspection System
LEI-1616AM, LEI-1618AM, LEI-1616RP, LEI-1618RP
LEI-1610E100AM, LEI-1610E100R
LEI-3200RP
LEI-1510EB, LEI-1510EC
LEI-1510EC-RP, LEI-1510EC-RS
PDL-1000
IND-1500
Atomic Force Microscope - Proberstation 2000
AFM Objective for optical Microscopes
SPL-2100
SPL-2200/2500
WT-1200iL
LSL-2500
SRP-2100i Spreading Resistance Profiler with I-V capability
EIR-2201 Enhanced Infrared Reflectometer
EIR-3000 Enhanced Infrared Reflectometer
EIR-2200 Enhanced Infrared Reflectometer
µSE / SE-3000 Microspot Spectroscopic Ellipsometer
µSE / SE-2200 Microspot Spectroscopic Ellipsometer
PMR-2200S Ion Implant Dose Monitor S
WT-2000 Wafer Tester - Tabletop System
MBM-2201 Non-Contact Mobility and Sheet Resistance Metrology System
COREMA-2000 Contactless Resistivity Mapper
DLS-1100 Deep Level Transient Spectrometer