Semilab is proud to release DLS-1200, the next generation addition to the Semilab DLS product family. Building on the excellence of its predecessor, the DLS-1200 is a state-of-the art sensitivity Semilab Deep Level Transient Spectroscopic device, designed for the wafer & EPI manufacturers, IC fabs and research institutes due to recent hardware and software improvements.

Deep-level transient spectroscopy (DLTS) is a characterization device for studying electrically active defects -known as charge carrier traps- in semiconductors. Recent developments in CMOS imaging technology and requirements for lower detection limits of metallic contamination in silicon have pushed the development of DLTS technique further to achieve more sensitive evaluation.

Equipped with different cryostats, DLS-1200 detects and identifies electrically active impurities over wide temperature ranges on semiconductor samples. The new DLS-1200 provides the same top-tier sensitivity, low-noise and full automation, and now comes with the previously optional TAS included as a standard.

Many cryostat options are available to cover measurements on wide temperature ranges, including Low Vibration, Automatic LN2, Bath Type LN2, and Closed Cycle He-Cryostat.

Semilab DLS-1200 is the successor of the DLS-1100 system, therefore DLS-1100 will be discontinued with the release of DLS-1200.

Contact us to learn more about this new advancement, get expert help to find the right cryostat for your new DLS system.