The 2026 edition of the International Conference on Thin Films (ICTF-20) will be held during the week of 8-12^th June in Biarritz, France. This conference is dedicated to gather experts of industry and academia, and to elevate the discussion about the development on thin films elaboration, characterization and applications. 

Semilab is waiting for you at booth No.6 with the latest additions to the Semilab R&D metrology portfolio, while József Szenka will also deliver an oral presentation on “Model-based optical critical dimension metrology of anamorphic distortion in high-aspect ratio holes”, as a part of the Thin film growth & modelling Session, starting at 4:00pm on Wednesday, 10^th June 2026.

Make sure to drop by, listen to his presentation, and share your thoughts at the Semilab booth later!

Hope to see you there!