We are proud to announce that Dr. Peter Basa, Deputy Division Manager of Semilab’s Optical Measurement Technologies, has been invited to join the Advisory Committee of the inaugural 1st American Workshop on Ellipsometry (AWE-1), taking place from February 28^th to March 3^rd, 2027, in Lincoln, NE, USA.

For decades, SEMILAB has been at the forefront of developing high-precision metrology solutions for the semiconductor, photovoltaic, display, and advanced materials industries, supporting innovation through cutting-edge measurement technologies and close collaboration with research institutes and industrial partners around the globe.

As a member of the Advisory Committee, Peter will help shape the scientific and technical direction of this inaugural event, contributing both his personal expertise and SEMILAB’s extensive experience in optical metrology and materials characterization.

Organized by the North American Ellipsometry Association, AWE-1 will be the very first American workshop dedicated exclusively to ellipsometry and related optical metrology techniques. The event aims to bring together leading industry experts, researchers, and students from around the world to exchange knowledge and discuss the latest scientific and technological advancements in the field.

AWE-1 marks an important milestone for the global ellipsometry community, and SEMILAB is honored to contribute to this first edition through Peter’s participation on the Advisory Committee. The workshop is expected to become a significant recurring forum for innovation, networking, and scientific exchange in the field of optical characterization.

For more information about the workshop, visit the website of the 1st American Workshop on Ellipsometry.

We hope to see you there next year!