The 10th International Symposium on Control of Semiconductor Interfaces (ISCSI-X), the International Conference on Silicon Epitaxy and International SiGe Technology and Device Meeting (ICSI/ISTDM 2025) will be held between 10-13^th November 2025, in Yokohama-shi, Kanagawa, Japan.

The events aim to provide a global platform for the industry players to discuss research results on semiconductor interfaces, exchange information, and work for the future semiconductor science and technology.

We are proud to share, that Tamás Sipőcz, R&D Team Leader of the Semilab Semi PL Imaging Team will be an invited speaker of the ICSI/ISTDM2025 event as well. In his talk, Tamás will discuss “Room Temperature Photoluminescence Detection of Defects on Si/SiGe Superlattice Samples” in the Nanotechnology and Electronic Characterization session, starting 9:00am on Thursday, November 13, 2025.

Register HERE