The purpose of this event is to bring together professionals and experts from the field of ellipsometry to exchange knowledge, discuss emerging trends, and collaborate on innovative solutions. With diverse speakers, interactive sessions, and networking opportunities, the workshop promises to be a valuable platform for intellectual growth and professional development.

Registration
Participation is free of charge, but it requires registration on the link below
https://mitnano.mit.edu/form/semilab-tool-talk-september-18-1

Venue
Massachusetts Institute of Technology - MIT.nano
12-0168 (MIT.nano basement) - Map

Agenda
Topics to be covered during the 2-days workshop :

• Introduction to spectroscopic ellipsometry
• Basic and advanced optical modeling
• Extended wavelength applications in the DUV, Near-IR, and Mid-IR. 
• Model-Based dimensional analysis for non-planar structures
• In-situ possibilities for spectroscopic ellipsometry