News & events

Wednesday, January 29, 2020

UCL’s Adaptive & Responsive Nanomaterials Group publishes tutorial overview on metrology of porous materials

Wednesday, January 29, 2020

Semilab has participated in XXth International Workshop on Physics of Semiconductor Devices (IWPSD 2019)

Tuesday, January 14, 2020

Semilab publishes correlation study of bulk Si stress and lithography defects using Polarized Stress Imager

Tuesday, January 14, 2020

Semilab has participated in Next Generation Materials For Solar Photovoltaics Symposium

Wednesday, December 11, 2019

Semilab has participated in SEMICON Japan 2019

Thursday, December 5, 2019

Semilab has participated in MIT Tool Talks with Semilab

Friday, November 29, 2019

Semilab has participated in MRS Fall Meeting & Exhibit 2019

Friday, November 29, 2019

Semilab publishes results on vertical cavity surface emitting laser (VCSEL) structures characterized by a novel model-based dimension (MBD) metrology method

Wednesday, November 13, 2019

Semilab has participated in Semicon Europa_2019

Monday, October 21, 2019

IBM Researcher Oki Gunawan and his collaborators have recently published a major breakthrough in the characterization of semiconductor properties in Nature.