FAST NON-CONTACT MATERIAL CHARACTERIZATION AND PROCESS CONTROL
Emitter sheet resistance is a primary quality control parameter for silicon wafers in PV applications after emitter diffusion.
The CLS models, CLS-1A, CLS-3A, and CLS-5A, Emitter Sheet Resistance Testers allow measurement of sheet resistance at 1 to 5 points with the high throughput that meets the requirements of in-line quality control in fully automated cell production lines.
The CMS models, CMS-1A, CMS-3A, Emitter Sheet Resistance Testers allow measurement of wafers “on the fly”, i.e. conveyor belt does not stop during measurement. Therefore, they have the high throughput that meets the requirement of in-line quality control in fully automated cell production lines.
Featrues and System specifications:
Wide variety of available interfaces to automation and MES: