WT-1200 & WT-1200B

Low Cost, Non-Contact Single-Point Measurement in Silicon

Both WT-1200 and WT-1200B provide fast, non-contact carrier lifetime measurement method that is capable of characterizing silicon material in each process step of solar cell manufacturing.

WT-1200 is designed to measure wafers from as-cut wafer to the finished solar cell. WT-1200B is a model for block measurements.

Features and System specifications:

• No need for access to back side of the wafer
• Fully automatic operation and data evaluation
• Measurement selectable at any position on the wafer
• Measurement of mono- and multi-crystalline material
• Patented chemical surface passivation option available for wafers
• Wafers can be measured after each process step of solar cell manufacturing:
  • Incoming as-cut wafer
  • Diffused wafers (with or without phosphorous glass)
  • Nitride coated wafers
  • Metallized wafers
  • Finished solar cells