The 20th Conference on Gettering and Defect Engineering in Semiconductor Technology (GADEST) will be held in Bad Schandau (Saxony, Germany) from September 8 to 13, 2024.

The GADEST conference is devoted to semiconductor defect physics, materials science and device technology and focuses on both fundamental as well as technological aspects of defects, growth, processing and modelling of electronic materials and devices, ranging from microelectronics to photovoltaics.

Semilab is also sponsoring the event as well. Tamás Szarvas, head of optical scattering microscopy department, will have a presentation on “Edge inspection of Si wafers for Bulk Microdefects” in the TuP poster session starting 19:00 10^th September 2024.

See you there!