Semilab is proud to release LumiPix-3000, a photoluminescence-based inspection system with full wafer imaging capabilities designed for detecting intensity and wavelength defects in microLED devices.

LumiPix leverages advanced photoluminescence technology with multiple excitation options and high-resolution imaging to provide comprehensive defect analysis. It is suitable for recording, storing, and displaying various measurement data for different microLED applications, with support for InGaN and AlInGaP materials on wafers up to 12 inches.

Its non-destructive metrology approach enables the identification of various defects, including intensity variations, wavelength shifts, and morphological anomalies, based on the analysis of the captured PL images and other relevant data, while also fulfills industrial standards with its modern platform.