Wide bandgap semiconductors are essential for innovation; however, their manufacturing, research, and development processes require a new approach in metrology. Semilab’s metrology solutions play a vital role in the wide bandgap materials market when it comes to measuring optical and electrical properties.

Semilab is also attending the event with a presentation on „High Throughput Wafer Characterization for Manufacturing Needs of SiC and Other WBG Technologies” in Session 11.2: CHARACTERIZATION, staring at 2:00 pm on May 23rd (Thursday) 2024. Our colleagues will be waiting at booth Nr. 403/405 to discuss your insight on the latest compound semiconductor news as well.