A new journal article entitled „Structural Characterization of Mesoporous Thin Film Architectures: A Tutorial Overview” was published in the frame of the existing cooperation between Semilab Co. Ltd. and the University College London’s Adaptive & Responsive Nanomaterials Group (https://semilab.com/news/semilab-ellipsometer-at-university-college-londons-adaptive-and-responsive-nanomaterials-group). The article presents a tutorial overview for the reliable structural characterization of mesoporous films. Various techniques are assessed side-by-side, including scanning electron microscopy (SEM), atomic force microscopy (AFM), grazing incidence small-angle X-ray scattering (GISAXS), and ellipsometric porosimetry (EP).
The article can be accessed online on the homepage of ACS Appl. Mater. Interfaces: https://pubs.acs.org/doi/10.1021/acsami.9b17899