The Workshop on Spectroscopic Ellipsometry (WSE) will be held between 9-12^th February 2026 at the University of Genova, IT, to brings together researchers and professionals working with ellipsometry and related optical characterization techniques, offering a forum for discussion and networking across academia and industry.

Semilab is proud to be a GOLD sponsor and exhibitor of the event, while actively participating in its scientific program as well. Máté Füredi, Applications Scientist of the Ellipsometry Application Team will present a talk on “In-situ ellipsometry based sorption for the critical dimension determination of grating structures” starting at 15:55 on 10^th February, in Session 2: Materials – Processing – in-situ.

Meanwhile, experts of the Semilab ellipsometry team will deliver 3 posters on various topics like:

• “Optical Metrology for Advanced Packaging: Insights from Imaging Spectroscopic Ellipsometry” presented by Attila Sütő, R&D Team Leader,
• “Spectroscopic Ellipsometry for Al Composition Determination in AlGaN: Cross-Metrology Validation” presented by Rebeka Vera Lévai, Applications Scientist, and
• “Optimized optical metrology of critical parameters of SiC trench MOSFET process steps”, presented by Boglárka Zsófia Dikó, Applications Scientist,

In the Poster Session, starting at 16:15 on 10^th February.

Come and learn more about their research results and about the latest advancements of the Semilab Ellipsometry Product Portfolio and the exhibitor area!

Hope to see you there!