The electronic display industry is subject to enormous flux, but demand typically remains high throughout periods of volatility. Numerous reasons underlie the market’s extraordinary resilience–even in times of significant economic downturn–but few are as impactful as our constant rate of technological innovation. Manufacturers continue to develop new and improved electrical devices from smart wearables to digital signage, and displays continue to play a fundamental role in their performance. Research and development (R&D) plays a crucial role in driving that innovation and meeting the evolving needs of consumers. This blog post will explore the importance of R&D in the display industry and discuss the essential lab tools enabling efficient and effective research.

How Lab Tools Enable Efficient Research and Development

A range of lab tools is necessary for research and development within the display industry. They allow scientists and researchers to conduct accurate measurements, analyze data, and develop new technologies. At one level, it is enough to rely on systems like function generators and multimeters. However, truly innovative technologies require more precise measurements. In this section, we look at some essential lab tools used in display industry R&D:

Spectroscopic Ellipsometry

Spectroscopic Ellipsometry (SE) is a non-destructive optical measurement technique used to determine the thickness and optical properties of thin films and multilayer structures. Semilab's µSE tool is designed to measure these properties inside a <50µm test pad on semiconductor product wafers. Ellipsometry measures the phase of the reflected light from the sample, showing remarkable insensitivity to intensity fluctuations. The raw measurement data represents the complex information from the layer stack, which then needs to be modeled optically. The measurement results are obtained through a numerical regression process of the model data to the raw measurement spectrum.

Imaging Spectroscopic Reflectometry

Imaging Spectroscopic Reflectometry (iSR) is a widely-used tool for thin film characterization, providing information on film layer thickness and optical properties. Semilab has developed a metrology that can determine the full thickness of OLED structures in one sub-pixel using a single measurement in a few seconds, with a lateral resolution as high as 5µm. This allows customers to fine-tune the printing process precisely. In Semilab's SR metrology, a wide range of wavelengths and high-intensity Xe-lamp is used, making it possible to select the measurement wavelength range according to specific process requirements.

Microwave Photoconductive Response (μ-PCR)

Microwave Photoconductive Response (μ-PCR) is a technique used to determine parameters related to device mobility and other layer quality parameters. The source of the field is a Voltage Controlled Oscillator (VCO), and the microwave local signal and reflection from the sample are measured[5]. The laser excitation is used in this technique.

Four Point Probe & Six Point Probe

The Four Point Probe (4PP) is a widely used contact technique for monitoring doping density, resistivity, or emitter sheet resistance values. The separation of voltage and current electrodes eliminates the effect of contact resistance from the measurement result. In the high resistivity range, the measurable current is limited, setting a limitation for the measurement.

Semilab's Six Pin Probe (6PP) technique overcomes the limitations of 4PP by using two additional pins to suppress the measurement noise as much as possible. The sample is contacted by four pins, and a current generator leads a defined current through the sample via the outer pins. The two inner pins are used to measure the voltage between them, and from these two parameters, the sample's sheet resistance can be calculated. The space between the pins is equal (1mm for 4PP and 1.5mm for 6PP), and the pin material is produced from tungsten carbide (4PP) and stainless steel (6PP).

The Role of Semilab in the Display Industry

Research and development lab tools are crucial in driving advancements in the display industry. These tools enable researchers to measure, analyze, and optimize display technologies, leading to innovative products that meet consumer demands.

At Semilab, we support the display industry in developing next-generation display technologies through precise measurements and tailored solutions. As the display market continues to evolve, R&D efforts and advanced lab tools will remain essential.

Our broad portfolio of thin film and surface characterization lab tools are widely used for display industry R&D. One product example is the Spectroscopic Ellipsometer, which allows fast and accurate measurement of thin film thickness and optical properties, enabling precise process control parameters determination.

We also offer advanced analysis software to work alongside our instruments that provides additional parameters. These include optical band gap energy, transmission, roughness, and crystallinity-related parameters. Furthermore, Semilab has developed metrology solutions for printed OLED structures, enabling precise thickness measurements and improving uniformity during the printing process.

Are you looking for more information about research and development tools for the display industry? Contact a member of Semilab today and find your ideal product.