Besides Semilab’s own automated wafer sorter platform, Semilab manufactures separate measurement units for integration into automated PV production lines. Semilab has been working together with all the relevant automation companies to integrate the measurement units.

The equipments cover a diverse range of metrology needs for comprehensive process and quality control in Si PV industry:

• Incoming wafer inspection and process control during cell manufacturing
• Measurement in as-cut wafer, textured, after diffusion, after passivation, after ARC deposition, after contact formation states
• Measurements of geometrical, electrical and optical properties
• Solutions for mono and multicrystalline silicon materials, Al-BSF, PERC, IBC and heterojunction cell concepts

All measurement units are designed considering the following directives:

• Compatibility to state-of-the-art production lines
• Supporting all the industry standard communication protocols
• Flexible integration
• Supporting both „on-the-fly” and „stop-and-go” data acquisition modes
• Compact design
• Simple integration and support
• Simple maintenance, rare calibration periods
• Application of noise reduction solutions
• Simple and configurable customization of communication protocols