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ACV-2200, ACV-3000, ACV-3100 Non-contact Resistivity Profiling Systems
ACV-2200, ACV-3000,
ACV-3100 NON-CONTACT
RESISTIVITY
PROFILING SYSTEMS
  • AIR-GAP CV PROFILING

AFM Tip Scanner
AFM OBJECTIVE FOR
OPTICAL MICROSCOPES
  • SCANNING PROBE MICROSCOPY (SPM) FOR NANO SURFACES
  • SCANNING PROBE MICROSCOPY (SPM) FOR R&D
  • SCANNING PROBE MICROSCOPY (SPM) FOR DEFECT CHARACTERIZATION
  • SCANNING PROBE MICROSCOPY (SPM) OF 3D STRUCTURES

AFM-1000 Atomic Force Microscope - Proberstation 1000
ATOMIC FORCE
MICROSCOPE -
PROBERSTATION 1000
  • SCANNING PROBE MICROSCOPY (SPM) FOR NANO SURFACES
  • SCANNING PROBE MICROSCOPY (SPM) FOR R&D
  • SCANNING PROBE MICROSCOPY (SPM) FOR DEFECT CHARACTERIZATION
  • SCANNING PROBE MICROSCOPY (SPM) OF 3D STRUCTURES

AFM-2000 Atomic Force Microscope - Proberstation 2000
ATOMIC FORCE
MICROSCOPE -
PROBERSTATION 2000
  • SCANNING PROBE MICROSCOPY (SPM) FOR NANO SURFACES
  • SCANNING PROBE MICROSCOPY (SPM) FOR R&D
  • SCANNING PROBE MICROSCOPY (SPM) FOR DEFECT CHARACTERIZATION
  • SCANNING PROBE MICROSCOPY (SPM) OF 3D STRUCTURES

CMS, CLS
CMS, CLS
  • SHEET RESISTANCE MEASUREMENT

COREMA-2000 Contactless Resistivity Mapping System for Semi-insulating Wafers
COREMA-2000
CONTACTLESS
RESISTIVITY MAPPER
  • Resistivity measurement for semi-insulators

Closed Cycle He-Cryostats for Semilab DLS systems
CRYOSTATS FOR
SEMILAB DLS SYSTEMS
  • DEEP LEVEL TRANSIENT SPECTROSCOPY - PV
  • DEEP LEVEL TRANSIENT SPECTROSCOPY

DLS-1000 Deep Level Transient Spectrometer
DLS-1000 DEEP LEVEL
TRANSIENT
SPECTROMETER
  • DEEP LEVEL TRANSIENT SPECTROSCOPY - PV
  • DEEP LEVEL TRANSIENT SPECTROSCOPY

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Iso-certificate
Iso-certificate