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ACV-2200, ACV-3000, ACV-3100 Non-contact Resistivity Profiling Systems
ACV-2200, ACV-3000,
ACV-3100 NON-CONTACT
RESISTIVITY
PROFILING SYSTEMS
  • AIR-GAP CV PROFILING

AFM-1000
AFM-1000
  • SCANNING PROBE MICROSCOPY (SPM) FOR NANO SURFACES
  • SCANNING PROBE MICROSCOPY (SPM) FOR R&D
  • SCANNING PROBE MICROSCOPY (SPM) OF 3D STRUCTURES
  • SCANNING PROBE MICROSCOPY (SPM) FOR DEFECT CHARACTERIZATION

AFM-2000
AFM-2000
  • SCANNING PROBE MICROSCOPY (SPM) FOR DEFECT CHARACTERIZATION
  • SCANNING PROBE MICROSCOPY (SPM) OF 3D STRUCTURES
  • SCANNING PROBE MICROSCOPY (SPM) FOR R&D
  • SCANNING PROBE MICROSCOPY (SPM) FOR NANO SURFACES

AFM-3000
AFM-3000
  • SCANNING PROBE MICROSCOPY (SPM) FOR DEFECT CHARACTERIZATION
  • SCANNING PROBE MICROSCOPY (SPM) OF 3D STRUCTURES
  • SCANNING PROBE MICROSCOPY (SPM) FOR NANO SURFACES

CMS, CLS
CMS, CLS
  • SHEET RESISTANCE MEASUREMENT

COREMA-2000 Contactless Resistivity Mapping System for Semi-insulating Wafers
COREMA-2000
CONTACTLESS
RESISTIVITY MAPPER
  • Resistivity measurement for semi-insulators

Closed Cycle He-Cryostats for Semilab DLS systems
CRYOSTATS FOR
SEMILAB DLS SYSTEMS
  • DEEP LEVEL TRANSIENT SPECTROSCOPY - PV
  • DEEP LEVEL TRANSIENT SPECTROSCOPY

Deep Level Transient Spectrometer
DLS-1100 DEEP LEVEL
TRANSIENT
SPECTROMETER
  • DEEP LEVEL TRANSIENT SPECTROSCOPY - PV
  • DEEP LEVEL TRANSIENT SPECTROSCOPY

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Iso-certificate
Iso-certificate