News & events

JSAP Spring 2026

Sunday
15/ Mar
2026
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Wednesday
18/ Mar
2026

2-12-1, Ookayama, Meguro-ku, Tokyo 152-8550, Japan

Monday, February 9, 2026

Semilab has participated in Workshop on Spectroscopic Ellipsometry (WSE) 2026

Thursday, February 5, 2026

Defect Inspection in the Early Stages of III-V Device Manufacturing

Tuesday, February 3, 2026

Semilab has participated in Semicon KOREA 2026

Tuesday, December 16, 2025

Dr. Péter Basa, Deputy Division Manager of Optical Measurement Technologies and Head of the Ellipsometry Department at Semilab, has been awarded the Dennis Gábor Award

Thursday, December 11, 2025

Semilab Launches New R&D Website to Highlight Material & Life Science Metrology Portfolio

Tuesday, December 9, 2025

Quartz Crystal Microbalance with Impedance Measurement - Semilab introduces the renewed QCM-I series

Friday, December 5, 2025

Semilab has participated in Semicon JAPAN 2025

Tuesday, December 2, 2025

Semilab introduces new, comprehensive metrology solution for microLED functional inspection

Tuesday, November 25, 2025

A new, non-contact, non-destructive, spectroscopy-based solution for stress and crystalline quality measurement – Semilab introduces the In-Line Raman Spectroscopy-based system, Raman-3000

Monday, November 24, 2025

SEMILAB has successfully acquired Bristol Nano Dynamics Ltd. (BND)