WT-2000PI
Complete measurement tool based on e-PCD technique for monitoring minority carrier lifetime in silicon ingots.
The WT-2000PI Lifetime Scanner is a complete measurement tool based on e-PCD technique for monitoring minority carrier lifetime without passivation in silicon ingots in size up to Ø300×500mm. The system provides fast, non-contact measurements (single-point, line scan and/or maps on silicon ingots. It has manual and automatic measurement modes and manual ingot loading capabilities.
Features and System specifications:
- Sample size: up to 300x500 mm
- Loading: manual
- Sample resistivity range: 0.5 to 10000 Ωcm
- Data output is in the form of color maps
- Easy exchange of data and images with other Windows application, e.g. Word processor
- Handling several data files at the same time
- Data evaluation during measurement
- Open network solutions like SECS/GEM based on TCP/IP protocol
- Open for local or remote database servers (ODBC)
- Open for communication like automatic or manual recording of sample
Optional:
- Slug measurement (minimum thickness required: 20mm)
- Resistivity measurement
- P/N conductivity type tester