WT-1200A

Quasi-Steady-State µ-PCD whit Quality of Decay control (QSS µ-PCD QD). Quality control of wafers and solar cells at different stages of production.

Measured parameters:

• Parameter free determination of Steady State Lifetime and Injection level
• Surface Recombination Velocity (S_max)
• Implied Voc
• Emitter Saturation Current (J₀)

Features and System specifications:

• Fully automatic operation and data evaluation
• Measurement selectable at any position on the wafer
• Measurement of mono- and multi-crystalline material
• Patented chemical surface passivation option available for wafers
• Lifetime of wafers can be measured after each process step of solar cell manufacturing:
  • Incoming as-cut wafer
  • Diffused wafers (with or without phosphorous glass)
  • Nitride coated wafers
  • Metallized wafers
  • Finished solar cells
• Advanced parameters (S_max, V_oc, J₀) can be measured after surface passivation steps