Products
News and Events
Literature
Projects
About us
Contacts
Career
Hungarian
English
Korean
Japanese
Simplified Chinese
Traditional Chinese
SEMICONDUCTOR INDUSTRY
PHOTOVOLTAIC INDUSTRY
DISPLAY INDUSTRY
RESEARCH & DEVELOPMENT
Products
- None -
SEMICONDUCTOR INDUSTRY
PHOTOVOLTAIC INDUSTRY
DISPLAY INDUSTRY
RESEARCH & DEVELOPMENT
ACV-2200,
ACV-3000,
ACV-3100
Non-contact
Resistivity
Profiling
Systems
AIR-GAP CV PROFILING
AFM Objective
for optical
Microscopes
SCANNING PROBE MICROSCOPY (SPM) FOR NANO SURFACES
SCANNING PROBE MICROSCOPY (SPM) FOR R&D
SCANNING PROBE MICROSCOPY (SPM) OF 3D STRUCTURES
SCANNING PROBE MICROSCOPY (SPM) FOR DEFECT CHARACTERIZATION
Atomic Force
Microscope -
Proberstation
1000
SCANNING PROBE MICROSCOPY (SPM) FOR NANO SURFACES
SCANNING PROBE MICROSCOPY (SPM) FOR R&D
SCANNING PROBE MICROSCOPY (SPM) OF 3D STRUCTURES
SCANNING PROBE MICROSCOPY (SPM) FOR DEFECT CHARACTERIZATION
Atomic Force
Microscope -
Proberstation
2000
SCANNING PROBE MICROSCOPY (SPM) FOR NANO SURFACES
SCANNING PROBE MICROSCOPY (SPM) FOR R&D
SCANNING PROBE MICROSCOPY (SPM) OF 3D STRUCTURES
SCANNING PROBE MICROSCOPY (SPM) FOR DEFECT CHARACTERIZATION
CMS, CLS
SHEET RESISTANCE MEASUREMENT
COREMA-2000
Contactless
Resistivity
Mapper
Resistivity measurement for semi-insulators
Cryostats for
Semilab DLS
systems
DEEP LEVEL TRANSIENT SPECTROSCOPY
DEEP LEVEL TRANSIENT SPECTROSCOPY - PV
DLS-1000 Deep
Level
Transient
Spectrometer
DEEP LEVEL TRANSIENT SPECTROSCOPY
DEEP LEVEL TRANSIENT SPECTROSCOPY - PV