News & events

Tuesday, May 11, 2021

SEMILAB publishes paper about Application of light scattering tomography for Si(111) samples

Monday, April 19, 2021

Semilab has participated in Silicon PV 2021

Friday, April 16, 2021

Semilab and ENEL-GP present a virtual poster at SiliconPV 2021 about the „Contactless sheet resistance characterization of silicon heterojunction structures using differential JPV technique”

Monday, April 12, 2021

Semilab has participated in SZTE Online Karriernapok 2021

Tuesday, April 6, 2021

SEMILAB publishes paper about bulk micro-defect detection with low-angle illumination

Tuesday, April 6, 2021

Semilab has participated in BME TTK Szakmai Nap

Tuesday, April 6, 2021

Semilab has participated in XVIII. Simonyi Konferencia (BME)

Saturday, March 20, 2021

New product release: LSL-2500 Bulk Micro Defect inspection system primarily for patterned wafers in failure analysis

Friday, March 19, 2021

SE-2000 supports research work of aluminium, gold-tin and titanium-tungsten alloys

Tuesday, January 26, 2021

Semilab has participated in Two-dimensional materials for scalable modular electronic pathogen sensors - Live Webinar