9th International Conference on Crystalline Silicon Photovoltaics

08/ Apr
10/ Apr

Semilab participates and presents poster in SiliconPV conference and nPV workshop.

Semilab presents a poster titled “Accurate Contact and Contactless Methods for Emitter Sheet Resistance Testing of PV Wafers”.

Sheet resistance of the emitter layers is a key parameter for solar cell performance. Its proper characterization is crucial in both PV production and R&D. Semilab researchers revealed important limitations and issues in conventional four point probe testing (4PP) of emitter layers on PV wafers. Simple technical solutions are presented to overcome the limitations of the standard 4PP measurement routines. Using optimized contact (4PP) and contactless (JPV) measuring conditions and parameters very good accuracy achieved by both methods in the entire range of today’s silicon PV wafer and cell parameters.

Authors: F. Korsós, P. TüttÅ‘, A. Tóth, I. Saegh, K. Kis-Szabó (Semilab)


Campus Gasthuisberg, Leuven, Belgium