Semilab will participate in the 2025 edition of International Conference on Compound Semiconductor Manufacturing Technology, a leading conference focused on compound semiconductor manufacturing, held between 19-22^nd of May 2025 in New Orleans, Louisiana, USA. CS MANTECH 2025 will bring together professionals from across the industry to discuss developments in materials, devices, and production technologies.

Tune in to insightful talks discussing our latest research results in SESSION 10B:  YIELD IMPROVEMENT IN CS MANUFACTURING:

- “Macro and Micro-Scale Non-Contact Imaging of Electrically Active Extended Defects in Merged PiN Schottky Diode Devices” – delivered by  Marshall Wilson, Application Scientist & R&D Manager of Semilab USA, starting at 10:40 AM, May 22^nd 2025, and

- “Determination of 4H-SiC Drift Layer Quality with Mercury Probe Capacitance-Voltage (CV) and Current-Voltage (IV) Measurements” – a publication created with Veeco, starting at 11:00 AM, May 22^nd 2025.

 Make sure to visit us at booth Nr. 511/513 as well, as our experts will deliver the latest additions to the Semilab semiconductor metrology portfolio.

Register HERE.