The 15th International Conference on Nitride Semiconductors (ICNS-15) will be held from 6^th to 11^th July 2025 in Malmö, Sweden, to celebrate 30 years of ICNS history and present high-impact scientific and technological advances in materials and devices based on group-III nitride semiconductors. ICNS-15 will feature plenary sessions, parallel topical sessions, poster sessions and an industrial exhibition and SEMILAB is proud to be not only among the exhibitors, but one of the GOLD sponsors of the event too.

Make sure to visit us at booth nr. 16, and during the scientific program as well, as Semilab will have two talks:

• Dr. Zsolt Szekrényes, Head of Optical Spectroscopy & Inspection Department, will have a talk on „Advancing GaN Metrology: Powerful Solutions for GaN Characterization” in which he will also introduce our newly released SPL-2200 metrology system, in the Industrial Session starting at 11:00 AM on Monday, 7^th July 2025,
• Marshall Wilson will have an oral presentation on “Correlation Study of AlGaN/GaN HEMT Structures Performed with Novel Wafer Level Capacitance Mapping Technique and Spectroscopic Ellipsometry” starting 5:00 PM on Tuesday, 8^th July 2025.

Our colleagues are preparing several publications for the poster sessions as well.

Join in from 5:00 PM on Monday, 7^th July and see:

• “Defect analysis comparing polarized stress imaging and X-ray topography methods on gallium nitride epitaxial layers on silicon and sapphire” by Dr. Teodóra Nagyné Kovács, Application Scientist of the Semi IR Imaging Team,
• “Optimizing GaN-Based Devices through Spectroscopic Ellipsometric Characterization if Thin Films and Layer Structures” by Rebeka Lévai, Application Scientist of the uSE and OCD Product Development Team,
• „Determination of the bulk refractive indexof AlN by spectroscopic ellipsometry” by László Makai, Senior Optical Development Engineer of the Product Marketing Department,

And on Thursday, 10th July:

• “Photoluminescence-based optical inspection for GaN / InGaN MicroLED wafers” by Sami Dzsaber, Senior Applications Scientist od the Optical Inspection Develoment Team.

Register HERE!