Wide Bandgap Metrology Insights: Bridging Research & Industry Needs

Metrology Workshop for Wide Bandgap Materials and Joint Lab Opening in Collaboration with Fraunhofer IISB

Semilab and Fraunhofer IISB will organize the Metrology Workshop for Wide Bandgap Materials on 1 April 2025 in Erlangen, Germany. This workshop also marks the official opening of the newly established Joint Metrology Laboratory, a significant milestone in our collaborative efforts to advance ultra-wide bandgap (UWBG) materials research and development.

The workshop will provide a platform for technical discussions and knowledge exchange surrounding the latest advancements and challenges in metrology for wide bandgap materials, mainly focusing on silicon carbide (SiC) and gallium nitride (GaN), critical to the development of high-efficiency power electronics, RF devices, and other advanced semiconductor applications.

This event will bring together experts, engineers, and scientists from the semiconductor industry and academia to explore cutting-edge metrology solutions, engage in technical discussions, and showcase the capabilities of the new laboratory — an initiative set to elevate R&D and provide long-term material metrology support for industry players across Europe.

Register here.