PLB-55i Silicon Block Scanner

This is a fast, non-contact, easy-to-use system to detect defects in silicon blocks for photovoltaic application.

Types of detectable defects:

• Crack
• Void
• Inclusion
• Growth band

Features and System specifications:

• Cut position is determined with 0.1 mm accuracy
• Integrated motor driven rotary stage for all 4 side measurement
• All 4 sides are measured automatically
• Automatic evaluation software
• Ingot type: Polished, non-polished
• Max. ingot size: 500×210×210 mm
• Operation: Automatic or manual
• Real time spot detection: Included
• 3D Visualization: Included
• Automatic evaluation: Included
• Automatic software evaluation with block images