The Semilab AMS SW-3300 uses the exclusive SurfaceWave™ technology to measure the thickness and uniformity of thin film metals and dielectrics. It’s a low cost but powerful product built expressly for copper, low k materials. It is a superior measurement of bottle trench, straight trench, dielectric layer thickness and composition.
Features and System specifications:
Dual load port configurable as:
Semilab AMS SW3300A
The advanced SW 3300A was announced mid-year 2007. It contains the same features as the SW 3300, and adds multiple layer measurements.Request Info