We are pleased to release the new Semilab Raman-3000, that provides a non-contact, non-destructive, spectroscopy-based solution for stress and crystalline quality measurement in semiconductor materials.

The system combines multi-wavelength Raman spectroscopy with automated wafer handling and mapping capabilities, enabling in-line process control up to 300 mm wafers. Raman-3000 is optimized for Si-based materials and advanced engineered substrates, including Si, SiGe, sSOI, and GeOI, which are essential for next-generation logic device fabrication.

Contact us to learn more and level up your quality control process with Semilab Raman-3000.