We're thrilled to announce that Semilab is featured in the latest issue of Compound Semiconductor magazine!
 
In our technical paper we discuss the potential of SiC for high-power applications and the intricacies of SiC epilayer characterization with an in-depth look at the 3 main methodology methods utilized by our FTIR-based metrology system, EIR-2300.

Check out the full article to learn more about the topic and explore how our next generation EIR metrology system can improve SiC device manufacturing:
https://lnkd.in/erBqCah