SEMILAB EIR system on cover of Compound Semiconductor Magazine


We're thrilled to announce that Semilab is featured in the latest issue of Compound Semiconductor magazine!
In our technical paper we discuss the potential of SiC for high-power applications and the intricacies of SiC epilayer characterization with an in-depth look at the 3 main methodology methods utilized by our FTIR-based metrology system, EIR-2300.

Check out the full article to learn more about the topic and explore how our next generation EIR metrology system can improve SiC device manufacturing: