PLB-55 Photoluminescence Silicon Block Imaging System

PLB is fast, non-contact, easy-to-use system to detect defects and impurity concentration in silicon blocks for photovoltaic application.

Features and System specifications:

Ingot Imaging system:

• Photoluminescence lifetime measurement - mapping for all 4 sides
• Max block size: 159×159×500 mm
• Block type: polished or non-polished block
• IR transition based inspection
• Built in integrated μ-PCD lifetime measurement with 1 probe for in-situ calibration - 1 line scan per side and lifetime calibration of the entire PL image.
• Block size determination with built Omron optical sensors
• Built in eddy head for resistivity measurement 1 line scan per side
• Built in P/N tester for conductivity type determination 1 line scan per side.
• Weight measurement (Max. 50 kg, 20 g accuracy)

Additional Measurements:

• Resistivity measurement with eddy head
• Lifetime measurement with μ-PCD head
• Temperature measurement with pyro sensor
• PN conductivity type measurement
• Block weight measurement
• Block size measurement
• Block angle measurement

Software evaluation:

• Calculated lifetime map
• Determination of the cutting line based on lifetime
• Determination of the cutting line based on resistivity
• Defect area percentage
• Colored images
• Export data to Excel

Options:

• High resolution images (transmission, PL)
• Fully automated robot support
• Block marker and printing
• G-code for CNC machines
• MES
• Slug measurement for R&D
• Language options: English, Chinese, Hungarian, for other, please contact us