AFM OBJECTIVE FOR
OPTICAL MICROSCOPES

AFM-2000

• SCANNING PROBE MICROSCOPY (SPM) FOR DEFECT CHARACTERIZATION
• SCANNING PROBE MICROSCOPY (SPM) OF 3D STRUCTURES
• SCANNING PROBE MICROSCOPY (SPM) FOR R&D
• SCANNING PROBE MICROSCOPY (SPM) FOR NANO SURFACES

SAMPLE TRANSFER
SHUTTLE

• SAMPLE TRANSFER SHUTTLE

SEM-AFM

• Scanning Electron Microscope integrated Atomic Force Microscopy (SEM AFM)